Rohde & Schwarz

mmWave and sub-THz active load-pull, gain compression and S parameter measurements

Published by Rohde & Schwarz

In recent years, there has been a substantial increase in the use of active devices operating at mmWave and sub-terahertz frequencies. Such devices find applications in various industries including automotive, radar, radio astronomy, remote sensing, military and others.

Measuring S-parameters has always been an accepted way to characterize these devices. We will have a look at how VNAs are used to characterize these DUTs for linear frequency converting and non-frequency-converting applications.

As the devices start to be driven into the non-linear regions, standard S-Parameters are not enough for a complete device characterization, and new techniques need to be used.

We will examine techniques that measure S-parameters at user-specified power levels, discuss making accurate and repeatable gain compression measurments, as well as non-50 ohm active load-pull measurements on DUTs under large signal conditions which make validating non-linear device models possible, and how to create ideal matching networks to maximize DUT performance.

Download Now


Required fields*

Please agree to the conditions

By requesting this resource you agree to our terms of use. All data is protected by our Privacy Notice. If you have any further questions please email .

More resources from Rohde & Schwarz